Carrier Concentration Mobility Tester

• 详细介绍
• 详细参数

• 详细介绍

  Carrier Concentration Mobility Tester

  
  

  In recent years, the research and development of organic semiconductor materials and devices have made rapid progress. Among them, organic electroluminescent diodes, organic thin film transistors, organic solar cells, organic memories, organic sensors, organic lasers and other related organic semiconductor materials and devices Research has achieved a lot of research results. With the in-depth research and development of organic semiconductor materials and devices, researchers have become more and more aware that the carrier transport capacity in organic semiconductors is a crucial factor that affects the performance of organic semiconductor devices. The main parameter to measure the carrier transport ability of organic semiconductor materials is the carrier mobility u, which directly reflects the mobility of carriers under the action of an electric field. Therefore, the measurement of carrier mobility is a study of organic semiconductor materials and devices. Important content in.

  
  

  Our company has launched a carrier mobility measurement system for organic solar cells OPV, perovskite solar cells, OLED devices and other organic semiconductor devices, providing powerful testing tools for the majority of scientific researchers and R&D institutions.

  
  

  main application:

  *Inorganic semiconductor materials, organic semiconductor materials OLED, etc.; *Organic solar cell OPV; *Perovskite Solar Cell; *Inorganic solar cells (such as monocrystalline silicon, polycrystalline silicon, amorphous silicon and other silicon-based solar cells); * Dye-sensitized solar cell DSSC;

  
  

  Main measurement functions:

  *Maximum power point MMP, FF, Voc, Isc, mobility, ideality factor (space charge limited current SCLC method) * electron and hole mobility, carrier trapping dynamics (transient photocurrent method) * electron and Hole recombination, carrier trapping dynamics process (transient photovoltage/transient open circuit voltage method) *trapping dynamics process (double pulse transient photocurrent) *carrier mobility (dark injection transient method) * Series resistance, geometric capacitance, RC time (voltage pulse method) * Doping density, permittivity, series resistance, carrier mobility (Dark state linear increase carrier transient method) * Carrier mobility, carrier Carrier density (light linear increase carrier transient method) * carrier recombination process, Langevin function composite pre-factor (time delay linear increase carrier transient method) * carrier intensity at different operating points, Carrier mobility (injection linear increase carrier transient method) * geometric capacitance, permittivity (MIS linear increase carrier transient method) * carrier mobility, trap strength, equivalent circuit (impedance Spectrum test) * Mobility, trap strength, capacitance, series resistance (capacitance VS frequency) * Built-in voltage, doping concentration, injection barrier, geometric capacitance (capacitance VS voltage) * Transmitting switch voltage (current voltage illuminance characteristics ) *Light-emitting lifetime, carrier mobility (transient electroluminescence method)

  
  

  Measurement technology:

  1) IV/IVL characteristics: IV and IVL curves are measurement methods for OLED and OPV standards. Through the curves, the relationship between current and voltage characteristics of the sample, and the relationship between current and voltage and light intensity can be obtained;

  *For solar cells, Pmax, FF, Voc, Isc, mobility, etc. can be analyzed by space charge limited current SCLC;

  2) Transient Photocurrent: Study the dynamic process of charge carrier trapping and carrier mobility in the device;

  3) Transient Photovoltage: Study the dynamic process and recombination process of charge carrier trapping inside the device;

  4) Double Transient Photocurrent: Analyze the dynamic process of charge carrier capture;

  5) Dark Injection: Analysis of charge carrier mobility;

  6) Voltage Pulse: Analysis of series resistance, geometric capacitance and RC effect;

  7) Dark-state linear pressurized carrier transient method (Dark-CELIV): measurement of impurity concentration, relative permittivity, series resistance, charge carrier mobility;

  8) Illuminated linear pressurized carrier transient method (Photo-CELIV): extracting the mobility of carriers in organic solar cells, and analyzing the carrier concentration, etc.;

  9) Time delay linear pressurized carrier transient method (Delaytime-CELIV): composite dynamic process analysis and Langevin composite factor analysis, etc.;

  10) Transient method of injected linear boosted carriers (Injection-CELIV): Measurement and analysis of charge carrier concentration and charge carrier mobility;

  11) MIS-CELIV: Geometric capacitance and relative permittivity analysis;

  12) Impedance Spectroscopy: measure the mobility of charge carriers and the dynamic process of carrier trapping in the device;

  13) Capacitance frequency measurement method (C-f): Mobility, trap, geometric capacitance and series resistance measurement;

  14) Capacitance voltage measurement method (C-V): Built-in voltage, impurity concentration and geometric capacitance measurement;

• 详细参数

• 产品特色

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• 详细介绍

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  AutoCal系统-Dynalog的先进水平校准技术，Dynalog是机器人单元标定技术的世界领导者。它的主流产品DynaCal 系统，被应用于离线的机器人单元校准，并作为最精确的和技术先进的机器人校准程序为许多机器人制造商和终端使用者所接受。AutoCal 系统将已证实的DynaCal校准技术结合到一个在线的全自动系统中，该系统专为程序控制和复原而设计的，价格低廉。