Scanning Kelvin Probe System

• 详细介绍
• 详细参数

• 详细介绍

  The Kelvin Probe is a non-contact, non-destructive oscillating capacitor device used to measure the work function of conductive materials or the surface potential of semiconductors and insulating surfaces.

  The work function of the material surface is usually determined by the top 1-3 layers of atoms or molecules, so the Kelvin probe is one of the most sensitive surface analysis techniques.

  
  

  Our Kelvin probe system includes:

  □Single-point Kelvin probe (atmospheric environment and atmosphere control environment);

  □Scan Kelvin probe (atmospheric environment and atmosphere control environment);

  □UHV Kelvin probe;

  □ Corrosion Kelvin probe for humidity control;

  
  

  Scanning Kelvin Probe System

  The ASKP system is a high-end scanning Kelvin probe system that can be received by most customers. It includes a color camera/TFT display, 2 mm and 50 micron probes, and external digital oscilloscopes on the basis of SKP. , And its specifications are as follows:

  □ 2 mm, 50 micron probe;

  □ Work function resolution 1-3 meV (2 mm tip), 5-10 meV (50 micron tip);

  □The height of the needle tip to the sample surface can reach within 400 nanometers;

  □3D map of surface potential and sample topography;

  □Probe scanning or sample scanning optional;

  □Color camera, focusing lens, TFT display and professional optical fixing device;

  □Reference sample (with corresponding scanning Kelvin probe system morphology);

  □Spare tip amplifier;

  
  

  Features of the instrument

  □The world's first commercial Kelvin probe system in the full sense;

  □The highest resolution work function and surface potential, the best stability and data reproducibility;

  □Non-zero patented technology (Off-null, ON) ——ON signal detection system works at high signal level. Compared with the system based on null-based (LIA), it will not be affected by noise. High sensitivity;

  □Patented height adjustment technology-Our instrument can control the height of the needle tip when measuring and scanning. Because the work function is affected by 　　　　　　　　　　　　　　　　　　　, the adjustment of the distance between the tip and the sample surface means that the data is highly reproducible and will not drift;

  □Has the best signal-to-noise ratio in this field;

  □Quick response time ——The measurement speed is between 0.1-10 seconds, which is much faster than other companies' products;

  □Powerful driver——Select the Voice-coil (VC) driver. Compared with the usual piezoelectric driver, the frequency of the VC driver is much more stable, the amplitude of the controlled needle tip is much larger, the parallel multi-probe operation is supported, and the support is different Diameter probe operation;

  
  

  Application field

  Adsorption, battery system, biology and biotechnology, catalysis, charge analysis, coating, corrosion, deposition, dipole layer formation, display technology, education, light/heat emission, Fermi scanning, fuel cell, ionization, MEMs, metals, microelectronics, nanotechnology, Oleds, phase transition, photosensitive dyeing, photovoltaic spectroscopy, polymer semiconductors, pyroelectrics, semiconductors, sensors, skin, solar cells, surface pollution, surface chemistry, surface photovoltaics, surface potential, Surface physics, thin film, vacuum research, work function engineering;

• 详细参数

  Full digital control of all Kelvin probe parameters;

  ON Non-zero detection Off Null detection

  HR Height Regulation mode

  SM actual Kelvin probe signal monitoring Monitoring of the actual Kelvin probe signal

  User Channels, simultaneous measurement of external parameters User Channels, simultaneous measurement of external parameters

  DC current detection system rejects drift effects Current Detection system rejects stray capacity effects

  Ideal, Parallel Plate Oscillation Mode

  SA signal average Signal Averaging (often termed Box-Car Detection)

  WA Work Function Averaging, Difference and Absolute reporting

  DC Digital Control of all Probe and Detection Parameters

  Quick-change Tip, variable spatial resolution

  DE data export Data Export to Excel, Origin, or 3rd party software

  OC output channel Output Channel: TTL switching of external circuit

  FC Faraday Cage (EMI Shield)

  RS Gold-Aluminium Reference Sample Gold-Aluminium Reference Sample

  
  

  Additional options

  SPV Surface Photovoltage Software and Hardware Package

  RH Relative Humidity Chamber

  Ambient Cell for controlled Gas Inlet

  EDS External Digital Oscilloscope

  OPT Color Camera Color Camera, TFT Screen and Optical Mounts

  ST needle tip replacement Replacement Tips

  GCT Gold Coated Replacement Tips

  XYZ 25.4 mm manual 3D console 3-axis 25.4 mm Manual Stage

  
  

• 产品特色

  因用于机器人各方面应用且与大多数机器人类型兼容，AutoCal系统可以检测出机器人自身构造和工具中心点（TCP）的 突然改变或偏离，并且该系统无需人为干涉就自动地更正这些误差。

  AutoCal系统-Dynalog的先进水平校准技术，Dynalog是机器人单元标定技术的世界领导者。它的主流产品DynaCal 系统，被应用于离线的机器人单元校准，并作为最精确的和技术先进的机器人校准程序为许多机器人制造商和终端使用者所接受。AutoCal 系统将已证实的DynaCal校准技术结合到一个在线的全自动系统中，该系统专为程序控制和复原而设计的，价格低廉。

• 详细介绍

  AutoCal系统提供在线的机器人校准方案，旨在快速和自动地保证机械设备的工作性能。因用于机器人各方面应用且与大多数机器人类型兼容，AutoCal系统可以检测出机器人自身构造和工具中心点（TCP）的 突然改变或偏离，并且该系统无需人为干涉就自动地更正这些误差。这意味着不用猜测哪里会出错，不用浪费宝贵时间在机器人程序重复校准上，产品品质无任何损失。

  AutoCal系统-Dynalog的先进水平校准技术，Dynalog是机器人单元标定技术的世界领导者。它的主流产品DynaCal 系统，被应用于离线的机器人单元校准，并作为最精确的和技术先进的机器人校准程序为许多机器人制造商和终端使用者所接受。AutoCal 系统将已证实的DynaCal校准技术结合到一个在线的全自动系统中，该系统专为程序控制和复原而设计的，价格低廉。