HALL EFFECT MEASUREMENT SYSTEM (HEMS)

• 详细介绍
• 详细参数

• 详细介绍

  HEMS is an integrated hardware and software system designed to measure and analyze the electronic properties of samples. The system allows measurements under a magnetic field up to 2.5 Tesla; with the combination of a cryostat, the magnetic field is up to 16 T.
  The system supports measurements in the range of 3 K – 1273 K with two different temperature measuring heads, and provides easy sample assembly via a probe system that can move in three axes.
  The NMI Hall Effect Measurement System performs electrical characterization of semiconductors, organic conductors, and metal oxide materials. These materials, developed using nanotechnology methods, are used in chip technology, solar cell development, material science, space technology, and the defense industry.
  
  Optional Heating Stage 
  
  Measurement Specifications
  Carrier mobility: 10⁻¹ to 10⁷ cm²/V·s
  Carrier concentration: up to 10²² /cm³
  Resistivity: 10⁻⁵ to 10⁹ Ω·cm
  Low Temperature AC-DC Measurement & Characterization
  Static Insert
  Six contacts for Hall effect, four contacts for van der Pauw measurement
  Sample size: max 10 mm × 10 mm
  Up to 12 contacts to sample
  29 mm OD sample insert (other sizes optional)
  25 spare sample holders
  Measurement electronics and control software
  Temperature range: 1–300 K
  Rotary Insert (Vertical and Horizontal Rotator)
  Rotation: 0°–360° with 0.016° resolution
  Sample size: max 5 mm × 10 mm
  Up to 12 contacts to sample
  29 mm OD sample insert (other sizes optional)
  25 spare sample holders
  Measurement electronics and control software
  Temperature range: 1–300 K
  KF50 or KF40 flange option
  DC Resistance / Hall Effect Measurements
  Source current programming range: 50 pA to 1 A
  Voltage measurement range: 100 mV (100 nV resolution) to 100 V (10 pV resolution)
  Temperature range: 1–300 K
  AC Resistance / Hall Effect Measurements
  Source current programming range: 2 nA to 100 mA
  Frequency range: 1 Hz to 1 kHz
  Real and imaginary parts of impedance Z(T)
  Voltage noise (with low-noise voltage preamplifier): 1 nV/√Hz noise floor at 1 kHz, 60 dB gain
  AC Susceptibility Measurement
  Sample size: max 5 mm diameter
  AC frequency range: 10 Hz to 10 kHz
  AC field amplitude range: 2 mOe to 150 Oe
  Sensitivity: 2 × 10⁻⁷ emu (2 × 10⁻¹⁰ A·m² at 10 kHz)
  Real and imaginary parts of susceptibility (T)
  Includes calibrated sensor at sample stage / pick-up coils
  Measurement electronics and control software
  Temperature range: 1–300 K
  Options
  Low-noise voltage preamplifier for AC resistance: 1.5 nV/√Hz noise floor at 1 kHz
  Voltage input range: ±5 V at ×1 gain
  Common mode rejection: 120 dB at 1 kHz
  Calibrated thermometer and heater at the sample stage
  400 K high-temperature option for measurement probes
  
  
  Shubnikov de Haas Oscillations in GaInAs Quantum Well
  
  Low Temperature Rotator 
  

• 详细参数

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• 详细介绍

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