LT-AFM/MFM | Low Temperature Microscope

• 详细介绍
• 详细参数

• 详细介绍

  LT-AFM/MFM | Low Temperature Microscope
  The LT-AFM/MFM is an alignment-free Atomic Force Microscopy system equipped with a Fibre Interferometer operating at 1310 nm, with 15 fm/√Hz noise level, an operation range of 20 mK–300 K, and up to 16 T magnetic field.
  The alignment-free design provides user-friendly operation. The Fibre Interferometer carries light via a fibre cable to the end of the cantilever and measures its deflection, providing 10 nm magnetic resolution at 4 K. Alignment chips with three protrusions compatible with commercial cantilevers eliminate the need for optical alignment by the user.
  The LT-AFM/MFM supports multiple imaging modes, including Scanning Hall Probe Microscopy, Magnetic Force Microscopy, Electric Force Microscopy, Kelvin Probe Force Microscopy, and Conductive AFM. The design can be customized for different cryostat dimensions.
  The microscope head consists of two concentric piezotubes: the inner tube for scanning and the outer tube for sample positioning. The scanning piezo includes quadrant electrodes and a dither piezo for cantilever dithering, with three configuration options available.
  Sample approach is performed using stick-slip motion, allowing 10 mm travel in Z and Ø3 mm in XY, with 50 nm sensitivity. Electronic signals are generated by the LT-AFM/MFM electronics via BNC outputs and transferred through LEMO connections.
  Scan Head Options
  Ultra Large Area
  200×200×7.2 μm @ 300 K
  50×50×4.8 μm @ 77 K
  30×30×2.4 μm @ 4.2 K
  Large Area
  150×150×7 μm @ 300 K
  36×36×1.8 μm @ 77 K
  18×18×0.8 μm @ 4.2 K
  Standard Area
  52×52×4.8 μm @ 300 K
  14×14×1.2 μm @ 77 K
  6×6×0.5 μm @ 4.2 K
  Ultra Low Noise LT-AFM with Fabry-Pérot Interferometer
  The new fiber Fabry-Pérot interferometer integrated into the LT-AFM/MFM operates in the 4–300 K range. A multilayer dielectric mirror-coated optical fiber achieves 1 fm/√Hz noise level, with a shot noise limit of 0.51 fm/√Hz.
  The cavity length is adjustable, and the fiber can be positioned close to the cantilever using a 2 mm stroke piezo nanopositioner integrated into the piezotube scanner. This nanopositioner can also park the fiber at a safe location during cantilever exchange.
  Scan Head Options
  Ultra Large Area
  200×200×7.2 μm @ 300 K
  50×50×4.8 μm @ 77 K
  30×30×2.4 μm @ 4.2 K
  Large Area
  150×150×7 μm @ 300 K
  36×36×1.8 μm @ 77 K
  18×18×0.8 μm @ 4.2 K
  Standard Area
  52×52×4.8 μm @ 300 K
  14×14×1.2 μm @ 77 K
  6×6×0.5 μm @ 4.2 K
  
  

• 详细参数

• 产品特色

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• 详细介绍

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