Surface photovoltage spectrometer

• 详细介绍
• 详细参数

• 详细介绍

  Surface photovoltage spectroscopy (SPV) represents a crucial investigative methodology in semiconductor research and numerous modern high-tech fields. At the semiconductor-metal interface, a surface potential barrier is generated. When light irradiates the contact interface between the sample and metal, a potential difference is established between the illuminated and non-illuminated surfaces. The relationship between this potential difference and the wavelength of incident light is recorded to obtain the surface photovoltage spectrum. SPV reflects the material's light absorption properties and interband electronic transitions, while being influenced by the lifetime of photogenerated carriers. SPV is predominantly employed for measuring the lifetime of non-equilibrium minority carriers, typically utilizing steady-state measurement techniques. By applying stable illumination to achieve a steady-state distribution of non-equilibrium minority carriers in semiconductors, this method enables precise and rapid determination of carrier lifetimes.
  Surface photovoltage spectroscopy stands as one of the most sensitive techniques for investigating solid surface properties (approximately 10^8 q/cm^2, where q represents unit charge). Its sensitivity surpasses that of XPS and Auger electron spectroscopy by several orders of magnitude. The method offers operational simplicity, excellent reproducibility, and maintains sample integrity without altering surface morphology during testing.
  A critical factor affecting measurement uncertainty in SPV is the stability of the light source. To address this, our company provides a high-stability 500W xenon lamp, significantly enhancing measurement accuracy.
  The WAD-SPV series surface photovoltage spectroscopy measurement system comprises several key components: a xenon lamp light source, an automatic scanning monochromator, fiber optic bundles, a lock-in amplifier, an optical chopper, a dark chamber, and data acquisition software.
  
  

• 详细参数

  The main technical parameters:
  Type of light source: xenon lamp
  Light source power: 500W
  Light source stability: better than 1% (up to 0.5%)
  Monochromator focal length: 300mm (type), 500mm focal length (type)
  The relative aperture of the monochromator: f/3.9 (type), f/6.5 (type)
  Monochromator output bandwidth: 0.1-16nm (type), 0.05-8nm (type)
  Spectral coverage: 200-1100nm (best spectral range: 330-1000nm)
  Monochromator data interface: USB2.0
  Brand and model of lock-in amplifier: SR510 from SRS, USA
  Chopper brand model: US SRS Company SR540
  Optical port type: optical fiber output
  Optical fiber bundle length: 1
  Fiber bundle diameter: 1mm
  The dark box can be operated horizontally or vertically, which is convenient for placing different types of solids, powders or solutions
  The data acquisition software can directly control the monochromator for wavelength and surface photovoltage signal acquisition,
  Optional models:
  Specification Description
  500W xenon lamp, 300mm focal length monochromator, fiber bundle output to dark box, SR510+SR540, software
  500W xenon lamp, 500mm focal length monochromator, fiber bundle output to dark box, SR510+SR540, software
  Model Specification Description
  WAD-SPV530 500W xenon lamp, 300mm focal length monochromator, fiber bundle output to dark box, SR510+SR540, software
  WAD-SPV550 500W xenon lamp, 500mm focal length monochromator, fiber bundle output to dark box, SR510+SR540, software
  [Note] The configuration of monochromator and lock-in amplifier can be configured according to customer needs, but the random software is not suitable for all brands of lock-in amplifiers. For details, please consult the company's sales department.
  

• 产品特色

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• 详细介绍

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